Work

Analysis and Testing of Conducted Electromagnetic Susceptibility in Integrated Circuits Based on Multi-Waveform Interference Using BCI

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications

DOI: 10.1109/mape62875.2024.10813969

Authors: Changshun Fu, Zhaowen Yan, Fuyu Zhao, Kunkun Hu, Ying Chen, Siyi Xing

Institution: Beihang University

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G1347977995

OpenAlex ID: W4405937356

FWCI:

Cites: 3

Cited by:

Related to: 10