Work

Transistor Breakdown Detection Circuit Design Based on CMOS BCD Process for High-voltage Output Stage of Neural Stimulators

Year: 2024

Type: conference-paper

Source: International Conference on Integrated Circuits and Microsystems (ICICM)

DOI: 10.1109/icicm63644.2024.10814162

Authors: Shengyuan Shi, Zeyu Lu, Xu Liu

Institution: Beijing University of Technology

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Good health and well-being

Open Access status: closed

OpenAlex ID: W4405937653

FWCI:

Cites: 7

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Related to: 10