Work

Electrostatic discharge failure and protection of single-walled carbon nanotube field-effect transistors

Year: 2024

Type: article

Source: Semiconductor Science and Technology

DOI: 10.1088/1361-6641/ada467

Authors: Yipeng Chen, Ling Zhang, Xinyu Zhu, Yunhao Jiang, Zhencheng Xu, Zhiliang Gao, Qianding Cheng, Li Zhou, Shurong Dong

Institutions: Zhejiang University, Beijing Orient Institute of Measurement and Test

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China-Zhejiang Joint Fund for the Integration of Industrialization and Informatization

OpenAlex ID: W4405954879

FWCI: 0.206

Cites: 17

Cited by: 2

Related to: 10