Work

LLM - TG: Towards Automated Test Case Generation for Processors Using Large Language Models

Year: 2024

Type: conference-paper

Source: Proceedings, IEEE International Conference on Computer Design/Proceedings - IEEE International Conference on Computer Design

DOI: 10.1109/iccd63220.2024.00066

Authors: Yifei Deng, Renzhi Chen, Chao Xiao, Zhijie Yang, Yuanfeng Luo, Jingyue Zhao, Na Li, Zhong Wan, Yongbao Ai, Huadong Dai, Lei Wang

Institution: National University of Defense Technology

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406014279

FWCI: 2.207

Cites: 12

Cited by: 8

Related to: 10