Work

Reduction of detectable fault size in sampled data residuals

Year: 2024

Type: article

Source: Memorias del Congreso Nacional de Control Automático

DOI: 10.58571/cnca.amca.2024.070

Authors: Universidad Autónoma de Nuevo León, México, Efraín Alcorta-García, Hector Alexis Lozano Flores, Universidad Autónoma de Nuevo León, México, Carlos Pérez Rojas, Universidad Michoacana de San Nicolás de Hidalgo, México

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406045864

FWCI: 0.16

Cites:

Cited by: 1

Related to: 10