Displacement damage effects in MoS2-based electronics
Year: 2024
Type: article
Source: Journal of Semiconductors
Authors: Kaiyue He, Zhanqi Li, Taotao Li, Yifu Sun, Shitong Zhu, Chao Wu, Huiping Zhu, Peng Lu, Xinran Wang, Maguang Zhu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406103333