Work

Research on IC-LOGO Extraction Algorithm Based on Deep Semantic Segmentation Network

Year: 2024

Type: conference-paper

DOI: 10.1109/icaica63239.2024.10823049

Authors: Yue Zhao, Mingfeng Guan, Jun Luo, Qiuzhen Zhang

Institution: China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406138026

FWCI:

Cites: 7

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Related to: 10