Work

IC-LOGO: A Custom Dataset and Benchmark for Integrated Circuit Logo Detection Task

Year: 2024

Type: conference-paper

DOI: 10.1109/icaica63239.2024.10823001

Authors: Yue Zhao, Jun Luo, Zhizhe Wang, Qiuzhen Zhang

Institution: China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406138215

FWCI:

Cites: 15

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Related to: 10