Work

Study of product production quality risk identification based on fault data

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.3595

Authors: Siming Hu, Fengsheng Jia, Jiaqi You

Language: English

Topic: Technology and Data Analysis

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406155502

FWCI:

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