Reliability simulation analysis technology for electronic products based on failure physics and failure propagate models
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Lingjie Zhang, Ning Hu, Zhe Lai, Jieyi Zhang, Hongqi Yang
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406155560