Research on reliability simulation based on electronic product digital mock-up
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Hong Wang, Yuxin Wang, Jianxin Liu
Institution: East China University of Political Science and Law
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406155586