AC series arc fault detection device based on multiple metrics and Random Forest
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Qi Wang, Xue Zhou, Wenxin Dai
Institution: Harbin Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406155670
