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An attempt to utilize functional modeling for enhanced application code analysis

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.3603

Authors: Zhenwen Wei, Jipu Wang, Yunfei Xu, Sijuan Chen, Jin Li, Ming Yang, Hao Liang, Zufeng Cao

Institutions: Shenzhen University, China Academy of Engineering Physics, University of Michigan

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406171060

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