Reliability evaluation of fuzz button contacts with random initial values
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Lei Zhang, Shujuan Wang, Xueyong Chen, Le Xu, Sanqiang Ling, Lei Mai, Jingyi Guo, Jiachen Zhang
Institutions: Harbin Institute of Technology, AVIC Optronics (China)
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406171675