A high-dimensional reliability analysis method via subspace updating and Gaussian process
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Yifan Li, Yongyong Xiang, Baisong Pan, Luojie Shi
Institution: Zhejiang University of Technology
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W4406171678