Work

Analysis and research on jitter based on eye diagram measurement of broadband sampling oscilloscope

Year: 2025

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.2882

Authors: Jiangmiao Zhu, Yidi Wang, Kejia Zhao, Yifan Wang, Kaige Man

Institutions: Beijing University of Technology, National Institute of Metrology

Language: English

Topic: Advancements in PLL and VCO Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406181887

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