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Investigating Wafer Surface Defect Detection: An Analysis of Approaches and Developments

Year: 2024

Type: conference-paper

DOI: 10.1109/icicnis64247.2024.10823128

Authors: P. Dharani Devi, G. Kavya

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406261799

FWCI:

Cites: 18

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Related to: 10