Steps Taken to Determine why Different IEC 1000-4-2 ESD Simulators Produce Different Results
Year: 1997
Type: conference-paper
Authors: Ken Hall, D. McCarthy, D. Dale, D. Smith, J. Nuebel, J. Barth, H. Hyatt
Institution: Hewlett-Packard (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406262450
