Work

Improving Identification of Defective Wafer Maps by Data Augmentation via Enhanced CycleGAN

Year: 2024

Type: conference-paper

Source: International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)

DOI: 10.1109/cce62852.2024.10770995

Authors: Lamia Alam, Nasser Kehtarnavaz

Institution: The University of Texas at Dallas

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406264655

FWCI: 1.51

Cites:

Cited by: 2

Related to: 10