Work

Research on IGBT Lifespan Prediction Method Based on LSTM

Year: 2024

Type: conference-paper

DOI: 10.1109/eit63098.2024.10762595

Authors: Hao Dou, Zhiqiang Wu

Institutions: University of South China, Nuclear Power Institute of China

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4406266930

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10