Work

Detection of Faults in Electronic Printed Circuits with Image Processing Methods

Year: 2024

Type: conference-paper

Source: Innovations in Intelligent Systems and Applications Conference (ASYU)

DOI: 10.1109/asyu62119.2024.10757036

Authors: Hasan Taylan Tataroğlu, Çağatay Berke Erdaş

Institution: Başkent University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406267057

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