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Enhancing Process Image Analysis with Adaptive Thresholding and Deep Learning Techniques

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Imaging Systems and Techniques (IST)

DOI: 10.1109/ist63414.2024.10759145

Authors: Hyeong Hu Park, Sung Jae Hwang, Do Gyun Kim

Institution: AP Systems (South Korea)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406267773

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