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Data Drift Quantification Metrics for Month-on-Month Semiconductor Data

Year: 2024

Type: conference-paper

DOI: 10.1109/wintechcon61988.2024.10838038

Authors: Nandita Bhattacharya, Adrita Barari, Lakshmi Narayana Pedapudi, Hoyeon Kim, Kyuhwan Kim, Jihye Seo

Institutions: Samsung (India), Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Data Stream Mining Techniques

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406354946

FWCI:

Cites: 18

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Related to: 10