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Bibliometric Study of Artificial Intelligence and Semiconductor Manufacturing Industry

Year: 2024

Type: conference-paper

Source: International Conference on Information and Communication Technology Convergence (ICTC)

DOI: 10.1109/ictc62082.2024.10827173

Authors: Koohee K won, Minyoung Lee, Eunil Park

Institutions: Samsung Electronics (South Korea), Sungkyunkwan University

Language: English

Topic: scientometrics and bibliometrics research

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406356086

FWCI:

Cites: 12

Cited by:

Related to: 10