Work

Label Defect Detection Based on Improved CenterNet

Year: 2024

Type: conference-paper

Source: International Conference on Pattern Recognition and Artificial Intelligence (PRAI)

DOI: 10.1109/prai62207.2024.10826835

Authors: Yani Fan, Hui Zhang, Hongwei Yue

Institution: Guangdong University of Education

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406356921

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Cites: 13

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Related to: 10