Work

Defect Detection on PCB Bare Boards Based on Improved YOLOv8 Algorithme

Year: 2024

Type: conference-paper

Source: International Conference on Cloud Computing, Big Data Application and Software Engineering (CBASE)

DOI: 10.1109/cbase64041.2024.10824269

Authors: Jin Yu, Yong bin Gao

Institution: Shanghai University of Engineering Science

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406356977

FWCI: 3.615

Cites: 6

Cited by: 5

Related to: 10