Characterization Of On-State Resistance By Interface Defects In SiC MOSFETs
Year: 2024
Type: conference-paper
Authors: Qianhui Wu, Qing Guo, Junze Li, Runze Xia, Jingkai Lin, Hengyu Wang, Na Ren, Kuang Sheng
Institution: Zhejiang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406460307