A Novel 4H-SiC FinFET with Alternating Deep P+ Wells for High Reliability
Year: 2024
Type: conference-paper
Authors: Runze Xia, Hengyu Wang, Qing Guo, Ce Wang, Qianhui Wu, Kuang Sheng
Institution: Zhejiang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406460314