Effects of JFET Widths on Static and Dynamic Characteristics in Silicon Carbide MOSFETs
Year: 2024
Type: conference-paper
Authors: Xinyu Li, Ling Sang, Yawei He, Xiping Niu, Zheyang Li, Rui Jin
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406460319