Work

Characterization Of Short-Circuit Failure Mode of Si/SiC Hybrid Devices

Year: 2024

Type: conference-paper

DOI: 10.1109/sslchinaifws64644.2024.10835369

Authors: Zhiqiao Chen, Qing Guo, Yiding Wu, Miaoguang Bai, Hengyu Wang, Ren Na, Kuang Sheng

Institution: Zhejiang University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406460359

FWCI:

Cites: 11

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Related to: 10