Work

Comparative Study of TID Irradiation Effect on SiC Planar and Trench MOSFET

Year: 2024

Type: conference-paper

DOI: 10.1109/sslchinaifws64644.2024.10835259

Authors: Zhen Fu, Zhanwei Shen, Xuan Tang, Yu Huang, Jinyi Xu, Kaige Huang, Quan Zhang, Yanning Chen, Chao Xiao, Kai Huang, Shizhong Yue, Zhijie Wang, Feng Zhang

Institutions: Chinese Academy of Sciences, Institute of Semiconductors

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406460447

FWCI: 2.344

Cites: 20

Cited by: 3

Related to: 10