Driving Safety Field-Based Scenario Generation of Key High-Risk Test Scenario Library for Intelligent Connected Vehicles
Year: 2024
Type: conference-paper
Authors: Pan Yuxiang, Bai Xianxu, Su Yao, Li Qin, Shi Qin, Chen Jiong, WEI Zhenya
Institutions: Hefei University of Technology, Nio (China)
Language: English
Subfield: Automotive Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4406460876
