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Research on Machine Vision Defect Detection Algorithm Based on Deep Learning

Year: 2024

Type: conference-paper

Source: International Conference on Electronics and Devices, Computational Science (ICEDCS)

DOI: 10.1109/icedcs64328.2024.00092

Authors: Yang Rongqiang, Jiang Quanxin

Institution: Jingchu University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Jingchu University of Technology, Jingmen Science and Technology Bureau

OpenAlex ID: W4406461803

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