Work

Error Analysis and Reduction in 3D Reconstruction Based on Structured Light

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Anti-counterfeiting, Security, and Identification (ASID)

DOI: 10.1109/asid63618.2024.10839712

Authors: Yuan Ji, Jiyang Yu, Lei Wang, Qiwei Meng, Xinhua Qiu, Chun Lin

Institution: Xiamen University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406522487

FWCI:

Cites: 1

Cited by:

Related to: 10