Work

Self-Explanatory Fault Diagnosis Framework for Industrial Processes Using Graph Attention

Year: 2025

Type: article

Source: IEEE Transactions on Industrial Informatics

DOI: 10.1109/tii.2025.3526708

Authors: Chae Sun Kim, Han Bit Kim, Jong Min Lee

Institution: Seoul National University

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Institute of Engineering Research, Seoul National University

OpenAlex ID: W4406522730

FWCI: 7.25

Cites: 25

Cited by: 27

Related to: 10