Work

Total Ionizing Dose in 0.13μm and 55nm SiGe : C HBTs

Year: 2024

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Adebabay Belie, A., Pascal, Fabien, Boch, Jérôme, Maraine, Tadec, Hoffmann, Alain, Bouhouche, Menel, Sagnes, Bruno, Haendler, Sébastien, Chevalier, Pascal, Gloria, Daniel

Institutions: Institut d'Électronique et des Systèmes, STMicroelectronics (France)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406600794

FWCI:

Cites:

Cited by:

Related to: 10