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Towards Adversarial Robustness in Blind Image Quality Assessment with Soft Thresholding Norm

Year: 2024

Type: conference-paper

Source: Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics

DOI: 10.1109/smc54092.2024.10831321

Authors: Desen Yuan, Lei Wang

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Adversarial Robustness in Machine Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406611659

FWCI:

Cites: 33

Cited by:

Related to: 10