Work

Failure analysis of a switching power supply

Year: 2024

Type: conference-paper

Source: International Conference on Computer Science and Application Engineering (CSAE)

DOI: 10.1145/3704814.3704828

Authors: Wang Honglun, Zhong Wenan, Zhang Dongjiu, Chen Shaojiang, Luo Hong

Institution: University of Science and Technology Beijing

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406620043

FWCI:

Cites: 2

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Related to: 10