Work

Enhanced Forging Process Defect Prediction: Utilizing CNN-SVM Hybrid Models for Precision and Efficiency

Year: 2024

Type: conference-paper

Source: Asian Conference on Innovation in Technology (ASIANCON)

DOI: 10.1109/asiancon62057.2024.10837967

Authors: Deepak Banerjee, Neha Sharma, Deepak Upadhyay, Vijay Singh

Institutions: Chitkara University, Graphic Era Hill University, Graphic Era University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4406657519

FWCI:

Cites: 10

Cited by:

Related to: 10