Work

Printed Circuit Board Defect Detection Using CNN Based Deep Learning Technique

Year: 2024

Type: conference-paper

Source: International Conference on Technological Advancements in Computational Sciences (ICTACS)

DOI: 10.1109/ictacs62700.2024.10840548

Authors: Viksith Bardia, M. Prabu

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4406658027

FWCI: 2.161

Cites: 18

Cited by: 3

Related to: 10