Work

Identification of Corn Leaf Disease Using Deep Learning

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Computational Intelligence and Communication Networks (CICN)

DOI: 10.1109/cicn63059.2024.10847360

Authors: Rekha Kaushik, Suryansh Yagnik, Aman Verma, Nitin Yadav

Institution: Indian Institute of Information Technology Bhopal

Language: English

Topic: Smart Agriculture and AI

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4406858653

FWCI:

Cites: 11

Cited by:

Related to: 10