Industrial computed tomography based intelligent non-destructive testing method for power capacitor
Year: 2024
Type: conference-paper
Abstract: Power capacitor device is a widely used reactive power compensation equipment in power transmission and distribution system which can easily have internal fault and therefore affects the safe operation of the power system. An intelligent non-destructive testing (I-NDT) method based on ICT is proposed to test the quality of power capacitors automatically in this study. The internal structure of power capacitors would be scanned by the ICT device and then defects could be recognized by the SSD algorithm. Moreover, the data augmentation algorithm is used to extend the image set to improve the stability and accuracy of the trained SSD model.
Authors: Zhenxing Cheng, Peng Wang, Wei Qin, Zidi Tang
Language: English
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4406892902
