Work

Resilience of Digital and Analog RRAM-Based ML Models to Device Variability: A Comparative Study

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Electronics, Circuits and Systems (ICECS)

DOI: 10.1109/icecs61496.2024.10848635

Authors: Tom Glint, Godwin Paul, Ankit Bende, Regina Dittmann, Vikas Rana

Institution: Forschungszentrum Jülich

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Bundesministerium für Bildung und Forschung

Award: NeuroSys: Memristor Crossbar Architekturen (Projekt A) - B

OpenAlex ID: W4406894631

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10