Work

A 28-nm 323 TOPS/mm2/b and 2007 TOPS/W/b Ternary Latch Based Sparsity-Aware CIM Macro With Double-Sampling Ternary ADC

Year: 2024

Type: conference-paper

Source: IEEE Asian Solid-State Circuits Conference (A-SSCC)

DOI: 10.1109/a-sscc60305.2024.10848571

Authors: Myoung Kim, Hoichang Jeong, Woo-Seok Kim, Yesong Jeong, Young-Eun Choi, Junyoung Park, Min Woo Ryu, Yong Kyu Lee, Kyuho Jason Lee, Kyung Rok Kim

Institutions: Ulsan National Institute of Science and Technology, Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of SMEs and Startups, Technology Development

OpenAlex ID: W4406894885

FWCI: 2.34

Cites: 1

Cited by: 3

Related to: 10