Work

Process Variability Impact on 7 nm FinFET Radiation Hardening Inverters

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Electronics, Circuits and Systems (ICECS)

DOI: 10.1109/icecs61496.2024.10848717

Authors: Marina Longo Dias, Cristina Meinhardt

Institution: Universidade Federal de Santa Catarina

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

OpenAlex ID: W4406895375

FWCI: 1.612

Cites:

Cited by: 2

Related to: 10