Work

Reliability Analysis of High-Voltage IGBT Series Components Considering Dynamic Voltage Imbalance

Year: 2024

Type: conference-paper

Source: International Conference on Power and Energy Systems (ICPES)

DOI: 10.1109/icpes63746.2024.10856578

Authors: Deshuai Sun, Haiyang Long, Hui Li, Xiao Wang

Institutions: Beijing Institute of Technology, Chongqing University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407026410

FWCI:

Cites: 7

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Related to: 10