Wire Bonding Failure Investigation in Semiconductor Packaging Process
Year: 2024
Type: conference-paper
Source: IEEE URUCON
Authors: Luana S. Rocha, Iara J. Fernandes, Celso Peter, Paulo R. Da S. Pereira
Institution: Universidade do Vale do Rio dos Sinos
Language: English
Subfield: Strategy and Management
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W4407026566
