Work

Conductance variability in RRAM and its implications at the neural network level

Year: 2025

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2025.115594

Authors: H. Aziza, M. Fieback, S. Hamdioui, H. Xun, M. Taouil

Institutions: Centre National de la Recherche Scientifique, Aix-Marseille Université, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence, Delft University of Technology

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407052255

FWCI: 1.577

Cites: 52

Cited by: 7

Related to: 10