Work

Gamut Excursion Measurements (GEM)—Improving CIE Usage

Year: 2024

Type: article

Source: SMPTE Motion Imaging Journal

DOI: 10.5594/jmi.2024/nyyp7085

Author: Lakshmanan Gopishankar

Language: English

Topic: Color Science and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407098305

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