Work

Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3535680

Authors: Vivek Kumar, Deepak Kumar Sharma, Sudeb Dasgupta, Arnab Datta

Institution: Indian Institute of Technology Roorkee

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407129049

FWCI:

Cites: 33

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Related to: 10